Daniel Limbrick

Research

I am currently a part of the Radiation Effects and Reliability group at Vanderbilt University. This group researches the impact of radiation induced errors on microelectronic circuits and tests methods for prevention. My research focus is mitigating the effects of soft errors on microelectronics through computer architecture design and VLSI design.

Curriculum Vitae

PhD Advisor: Dr. William H. Robinson

Research Interests

  • Logic Synthesis
  • Computer Architecture
  • Reliability of Digital CMOS Circuits

Projects

  • Self-checking ALU with Berger Codes
  • Radiation Hardening By Architecture of Multicore Systems
  • Reliability characterization of library cells in EDA

Recent Publications

  • [1] Daniel B. Limbrick, Suge Yue, William H. Robinson, and Bharat L. Bhuva, "Impact of Synthesis Constraints on Error Propagation Probability of Digital Circuits," Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, October 2011
  • [2] Daniel B. Limbrick, Dolores A. Black, Kevin Dick, Nicholas M. Atkinson, Nelson J. Gaspard, Jeffrey D. Black, William H. Robinson, Arthur F. Witulski, "Impact of Logic Synthesis on Soft Error Vulnerability Using a 90-nm Bulk CMOS Digital Cell Library," Proceedings of the IEEE SoutheastCon, March 2011.